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[Laboratory Practice Equipment (Special Requirements)] Purchase A Scanning Electron Microscope
| Acheteur : Pusan National University | |
| Create/Change Date : 2024-05-09 00:20:52 | Pays : [South Korea] |
| Date limite : 2024-05-23 00:00:00 | Type : Request for Expressions of Interest |
| Langue originale : kr | |
| Valeur estimée : | View Details |
Field Emission Scanning Electron Microscope
| Acheteur : Seoul National University of Science and Technology | |
| Create/Change Date : 2024-05-09 00:21:04 | Pays : [South Korea] |
| Date limite : 2024-05-23 00:00:00 | Type : Request for Expressions of Interest |
| Langue originale : kr | |
| Valeur estimée : | View Details |
Acquisition Of An Ebsd Camera And An Eds Detector Coupled On The Feg Sem Of The I2M Microscopy Platform And Associated Services, For The University Of Bordeaux
| Acheteur : UNIVERSITÉ DE BORDEAUX | |
| Create/Change Date : 2024-05-08 21:23:34 | Pays : [France] |
| Date limite : 2024-06-12 00:00:00 | Type : Invitation for Bids |
| Langue originale : French | |
| Valeur estimée : 0 EUR | View Details |
Filed Emisstion Scanning Electron Microscope
| Acheteur : Kumoh Institute of Technology | |
| Create/Change Date : 2024-05-09 05:21:16 | Pays : [South Korea] |
| Date limite : 2024-05-21 00:00:00 | Type : Invitation for Bids |
| Langue originale : kr | |
| Valeur estimée : | View Details |
Maintenance And Repair Of A Quanta Feg 250 Scanning Electron Microscope
| Acheteur : BA047-24 | |
| Create/Change Date : 2024-05-09 04:20:48 | Pays : [Germany] |
| Date limite : 2024-05-23 00:00:00 | Type : Invitation for Bids |
| Langue originale : German | |
| Valeur estimée : | View Details |
Acquisition Of An Ebsd Camera And An Eds Detector Coupled On The Feg Sem Of The I2M Microscopy Platform And Associated Services, For The University Of Bordeaux
| Acheteur : UNIVERSITÉ DE BORDEAUX | |
| Create/Change Date : 2024-05-08 21:23:22 | Pays : [France] |
| Date limite : 2024-06-12 00:00:00 | Type : Invitation for Bids |
| Langue originale : French | |
| Valeur estimée : 150000 EUR | View Details |
Scanning Electron Microscopy (Sem)
| Acheteur : Kyungpook National University College of Engineering | |
| Create/Change Date : 2024-05-08 00:21:01 | Pays : [South Korea] |
| Date limite : 2024-05-22 00:00:00 | Type : Request for Expressions of Interest |
| Langue originale : kr | |
| Valeur estimée : | View Details |
Field Emission Scanning Electron Microscope
| Acheteur : KANGWON NATIONAL UNIVERSITY | |
| Create/Change Date : 2024-05-08 05:23:01 | Pays : [South Korea] |
| Date limite : 2024-05-21 00:00:00 | Type : Invitation for Bids |
| Langue originale : kr | |
| Valeur estimée : | View Details |
Purchase Of Metrology Lab Equipment, Sir Lanka
Open New Window
| Acheteur : UNIDO | |
| Create/Change Date : 2024-05-07 21:20:51 | Pays : [Sri Lanka] |
| Date limite : 2024-05-27 00:00:00 | Type : Invitation for Bids |
| Langue originale : English | |
| Valeur estimée : 0 USD | View Details |
Scanning Electron Microscopy (Sem)
| Acheteur : CHUNGBUK NATIONAL UNIVERSITY | |
| Create/Change Date : 2024-05-08 00:21:02 | Pays : [South Korea] |
| Date limite : 2024-05-22 00:00:00 | Type : Request for Expressions of Interest |
| Langue originale : kr | |
| Valeur estimée : | View Details |
[Re-Announcement] Purchase 1 Type Of Compact Scanning Electron Microscope
| Acheteur : Dankook University Cheonan Campus Industry-Academic Cooperation Foundation | |
| Create/Change Date : 2024-05-08 05:23:18 | Pays : [South Korea] |
| Date limite : 2024-05-22 00:00:00 | Type : Invitation for Bids |
| Langue originale : kr | |
| Valeur estimée : | View Details |
Field Emission Scanning Electron Microscope
| Acheteur : Hankyung National University | |
| Create/Change Date : 2024-05-08 05:23:01 | Pays : [South Korea] |
| Date limite : 2024-06-04 00:00:00 | Type : Invitation for Bids |
| Langue originale : kr | |
| Valeur estimée : | View Details |
Technical Specifications For Purchase Of Metrology Laboratory Equipment Project “Support To Quality Infrastructure In Armenia” Proje Ct Number: 210152
Open New Window
| Acheteur : UNIDO | |
| Create/Change Date : 2024-05-08 15:20:54 | Pays : [Ethiopia] |
| Date limite : 2024-05-13 00:00:00 | Type : Invitation for Bids |
| Langue originale : English | |
| Valeur estimée : 0 USD | View Details |
The Right To Enter Into An Agreement For Maintenance Of The Carl Zeiss Sigma Electron Microscope.
| Acheteur : JOINT STOCK COMPANY "INDUSTRIAL INNOVATIONS" | |
| Create/Change Date : 2024-05-03 18:20:52 | Pays : [Russia] |
| Date limite : 2024-05-17 00:00:00 | Type : Invitation for Bids |
| Langue originale : Russian | |
| Valeur estimée : 319028000 RUB | View Details |
Nasa Thermo Fisher Environmental Scanning Electron Microscope (Esem)
| Acheteur : National Aeronautics and Space Administration | |
| Create/Change Date : 2024-05-08 07:21:28 | Pays : [United States] |
| Date limite : 2024-05-20 00:00:00 | Type : Invitation for Bids |
| Langue originale : English | |
| Valeur estimée : USD | View Details |
Transmission Electron Microscope
| Acheteur : Universität Stuttgart | |
| Create/Change Date : 2024-05-02 21:23:15 | Pays : [Germany] |
| Date limite : 2024-06-03 00:00:00 | Type : Invitation for Bids |
| Langue originale : German | |
| Valeur estimée : 0 | View Details |
Transmission Electron Microscope
| Acheteur : Universität Stuttgart | |
| Create/Change Date : 2024-05-02 14:21:13 | Pays : [Germany] |
| Date limite : 2024-06-03 00:00:00 | Type : Invitation for Bids |
| Langue originale : German | |
| Valeur estimée : 0 EUR | View Details |
Plasma Focused Ion Beam - Scanning Electron Microscope Dualbeam System
| Acheteur : Korea Electronics Research Institute | |
| Create/Change Date : 2024-05-02 04:21:42 | Pays : [South Korea] |
| Date limite : 2024-05-28 00:00:00 | Type : Invitation for Bids |
| Langue originale : kr | |
| Valeur estimée : | View Details |
Plasma Focused Ion Beam - Scanning Electron Microscope Dualbeam System
| Acheteur : the Republic of Korea (PPS) Public Procurement Service | |
| Create/Change Date : 2024-04-30 17:20:51 | Pays : [South Korea] |
| Date limite : 2024-06-11 00:00:00 | Type : Invitation for Bids |
| Langue originale : English | |
| Valeur estimée : 1142000 KRW | View Details |
Field Emission Scanning Electron Microscope
| Acheteur : KANGWON NATIONAL UNIVERSITY | |
| Create/Change Date : 2024-05-01 00:21:02 | Pays : [South Korea] |
| Date limite : 2024-05-15 00:00:00 | Type : Request for Expressions of Interest |
| Langue originale : kr | |
| Valeur estimée : | View Details |
Plasma Focused Ion Beam - Scanning Electron Microscope Dualbeam System
| Acheteur : Korea Electronics Research Institute | |
| Create/Change Date : 2024-05-01 04:21:23 | Pays : [South Korea] |
| Date limite : 2024-06-11 00:00:00 | Type : Invitation for Bids |
| Langue originale : kr | |
| Valeur estimée : | View Details |
Cs Corrected Transmission Electron Microscope
| Acheteur : Pusan National University | |
| Create/Change Date : 2024-05-01 04:21:38 | Pays : [South Korea] |
| Date limite : 2024-05-14 00:00:00 | Type : Invitation for Bids |
| Langue originale : kr | |
| Valeur estimée : | View Details |
Procurement Of Various Laboratory Equipment For The University
Open New Window
| Acheteur : FAO | |
| Create/Change Date : 2024-04-30 21:21:00 | Pays : [Georgia] |
| Date limite : 2024-05-14 00:00:00 | Type : Invitation for Bids |
| Langue originale : English | |
| Valeur estimée : 0 USD | View Details |
High Resolution Cs Corrected Scanning Transmission Electron Microscopy
| Acheteur : ULSAN INSTITUTE OF SCIENCE AND TECHNOLOGY | |
| Create/Change Date : 2024-05-01 04:21:38 | Pays : [South Korea] |
| Date limite : 2024-05-14 00:00:00 | Type : Invitation for Bids |
| Langue originale : kr | |
| Valeur estimée : | View Details |
Field Emission Scanning Electron Microscope
| Acheteur : Pukyong National University | |
| Create/Change Date : 2024-05-01 04:21:38 | Pays : [South Korea] |
| Date limite : 2024-05-14 00:00:00 | Type : Invitation for Bids |
| Langue originale : kr | |
| Valeur estimée : | View Details |